Timed Model-Based Mutation Operators for Simulink Models

Timed Model-Based Mutation Operators for Simulink Models. Chen, J., Alalfi, M. H., & Dean, T. R. In IEEE International Conference on Software Testing, Verification and Validation, ICST 2024 - Workshops, Toronto, ON, Canada, May 27-31, 2024, pages 263–272, 2024. IEEE.

Paper doi bibtex

@inproceedings{DBLP:conf/icst/ChenAD24,
  author       = {Jian Chen and
                  Manar H. Alalfi and
                  Thomas R. Dean},
  title        = {Timed Model-Based Mutation Operators for Simulink Models},
  booktitle    = {{IEEE} International Conference on Software Testing, Verification
                  and Validation, {ICST} 2024 - Workshops, Toronto, ON, Canada, May
                  27-31, 2024},
  pages        = {263--272},
  publisher    = {{IEEE}},
  year         = {2024},
  url          = {https://doi.org/10.1109/ICSTW60967.2024.00055},
  doi          = {10.1109/ICSTW60967.2024.00055},
  timestamp    = {Tue, 01 Oct 2024 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/icst/ChenAD24.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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