A scalable software-based self-test methodology for programmable processors. Chen, L., Ravi, S., Raghunathan, A., & Dey, S. In Proceedings of the 40th Design Automation Conference, DAC 2003, Anaheim, CA, USA, June 2-6, 2003, pages 548–553, 2003.
A scalable software-based self-test methodology for programmable processors [link]Paper  doi  bibtex   
@inproceedings{DBLP:conf/dac/ChenRRD03,
  author    = {Li Chen and
               Srivaths Ravi and
               Anand Raghunathan and
               Sujit Dey},
  title     = {A scalable software-based self-test methodology for programmable processors},
  booktitle = {Proceedings of the 40th Design Automation Conference, {DAC} 2003,
               Anaheim, CA, USA, June 2-6, 2003},
  pages     = {548--553},
  year      = {2003},
  crossref  = {DBLP:conf/dac/2003},
  url       = {http://doi.acm.org/10.1145/775832.775973},
  doi       = {10.1145/775832.775973},
  timestamp = {Mon, 30 May 2016 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/dac/ChenRRD03},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}

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