A scalable software-based self-test methodology for programmable processors. Chen, L., Ravi, S., Raghunathan, A., & Dey, S. In Proceedings of the 40th Design Automation Conference, DAC 2003, Anaheim, CA, USA, June 2-6, 2003, pages 548–553, 2003.
Paper doi bibtex @inproceedings{DBLP:conf/dac/ChenRRD03,
author = {Li Chen and
Srivaths Ravi and
Anand Raghunathan and
Sujit Dey},
title = {A scalable software-based self-test methodology for programmable processors},
booktitle = {Proceedings of the 40th Design Automation Conference, {DAC} 2003,
Anaheim, CA, USA, June 2-6, 2003},
pages = {548--553},
year = {2003},
crossref = {DBLP:conf/dac/2003},
url = {http://doi.acm.org/10.1145/775832.775973},
doi = {10.1145/775832.775973},
timestamp = {Mon, 30 May 2016 01:00:00 +0200},
biburl = {https://dblp.org/rec/bib/conf/dac/ChenRRD03},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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