Analog Module Metrology Using MNABST-1 P1149.4 Test Chip. Chen, Y. & Su, C. In Asian Test Symposium, pages 378-382, 1998. IEEE Computer Society.
Analog Module Metrology Using MNABST-1 P1149.4 Test Chip. [link]Link  Analog Module Metrology Using MNABST-1 P1149.4 Test Chip. [link]Paper  bibtex   
@inproceedings{conf/ats/ChenS98,
  added-at = {2016-01-13T00:00:00.000+0100},
  author = {Chen, Y.-T. and Su, C.},
  biburl = {http://www.bibsonomy.org/bibtex/2aac2913e1f67a1785f408e0c874b9bbf/dblp},
  booktitle = {Asian Test Symposium},
  crossref = {conf/ats/1998},
  ee = {http://doi.ieeecomputersociety.org/10.1109/ATS.1998.741642},
  interhash = {06faf8967afac0321c168fb2f6b2a1b8},
  intrahash = {aac2913e1f67a1785f408e0c874b9bbf},
  isbn = {0-8186-8277-9},
  keywords = {dblp},
  pages = {378-382},
  publisher = {IEEE Computer Society},
  timestamp = {2016-01-15T11:37:06.000+0100},
  title = {Analog Module Metrology Using MNABST-1 P1149.4 Test Chip.},
  url = {http://dblp.uni-trier.de/db/conf/ats/ats1998.html#ChenS98},
  year = 1998
}
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