Characterization of Silicon Micro-Optic Structures with a Near-Infrared Near-Field Scanning Optical Microscope. Chen, W., Sun, L., Sarangan, A., & Zhan, Q. In Frontiers in Optics, pages FTuT5, 2006. OSA.
Characterization of Silicon Micro-Optic Structures with a Near-Infrared Near-Field Scanning Optical Microscope [link]Website  abstract   bibtex   
We report the instrumentation of a near-infrared near-field scanning optical microscope (NSOM). This NSOM is applied for the characterization of a simple yet novel silicon micro-optic device. © 2006 OSA.
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 title = {Characterization of Silicon Micro-Optic Structures with a Near-Infrared Near-Field Scanning Optical Microscope},
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 year = {2006},
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 abstract = {We report the instrumentation of a near-infrared near-field scanning optical microscope (NSOM). This NSOM is applied for the characterization of a simple yet novel silicon micro-optic device. © 2006 OSA.},
 bibtype = {inProceedings},
 author = {Chen, Webin and Sun, Lirong and Sarangan, Andrew and Zhan, Qiwen},
 booktitle = {Frontiers in Optics}
}
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