Reliability Analysis For Thin Film Thermocouple Thermal Oxidation Failure Based On Interlayer Diffusion. Chen, Z., Sun, Y., & Xue, Y. Unknown Journal, 2023.
Paper bibtex @article{2765,
author = {Zhi-Kuan Chen and Ye Sun and Yongbiao Xue},
title = {Reliability Analysis For Thin Film Thermocouple Thermal Oxidation Failure Based On Interlayer Diffusion},
year = {2023},
journal = {Unknown Journal},
url = {https://doi.org/10.1109/dsa59317.2023.00079}
}
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