Reliability Analysis For Thin Film Thermocouple Thermal Oxidation Failure Based On Interlayer Diffusion. Chen, Z., Sun, Y., & Xue, Y. Unknown Journal, 2023.
Reliability Analysis For Thin Film Thermocouple Thermal Oxidation Failure Based On Interlayer Diffusion [link]Paper  bibtex   
@article{2765,
  author = {Zhi-Kuan Chen and Ye Sun and Yongbiao Xue},
  title = {Reliability Analysis For Thin Film Thermocouple Thermal Oxidation Failure Based On Interlayer Diffusion},
  year = {2023},
  journal = {Unknown Journal},
  url = {https://doi.org/10.1109/dsa59317.2023.00079}
}

Downloads: 0