Cross-Layer Resilience in Low-Voltage Digital Systems: Key Insights. Cheng, E., Abraham, J. A., Bose, P., Buyuktosunoglu, A., Campbell, K. A., Chen, D., Cher, C., Cho, H., Le, B., Lilja, K., Mirkhani, S., Skadron, K., Stan, M. R., Szafaryn, L. G., Vezyrtzis, C., & Mitra, S. Unknown Journal, 2017.
Cross-Layer Resilience in Low-Voltage Digital Systems: Key Insights [link]Paper  bibtex   
@article{2641,
  author = {Eric Cheng and Jacob A. Abraham and Pradip Bose and Alper Buyuktosunoglu and Keith A. Campbell and Deming Chen and Cheng-Yong Cher and Hyungmin Cho and Binh Le and K. Lilja and Shahrzad Mirkhani and Kevin Skadron and Mircea R. Stan and Lukasz G. Szafaryn and Christos Vezyrtzis and Subhasish Mitra},
  title = {Cross-Layer Resilience in Low-Voltage Digital Systems: Key Insights},
  year = {2017},
  journal = {Unknown Journal},
  url = {https://doi.org/10.1109/iccd.2017.103}
}

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