Robust random chip ID generation with wide-aperture clocked comparators and maximum likelihood detection. Choi, Y. & Kim, J. In Circuits and Systems (ISCAS), 2013 IEEE International Symposium on, pages 1014–1017, 2013. IEEE. ![Robust random chip ID generation with wide-aperture clocked comparators and maximum likelihood detection [link]](https://bibbase.org/img/filetypes/link.svg "link")
Paper bibtex @inproceedings{choi_robust_2013,
title = {Robust random chip {ID} generation with wide-aperture clocked comparators and maximum likelihood detection},
url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6572021},
urldate = {2015-01-29TZ},
booktitle = {Circuits and {Systems} ({ISCAS}), 2013 {IEEE} {International} {Symposium} on},
publisher = {IEEE},
author = {Choi, Yunju and Kim, Jaeha},
year = {2013},
keywords = {⛔ No DOI found},
pages = {1014--1017}
}
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