A new mechanism of signal path charging damage across separated power domain deep N-Well interface. Chu, Y., Kuo, H., Hsu, S., Tsai, Y., Wang, M., Chang, C., Kiang, B., & Wu, K. In IRPS, pages 6, 2018. IEEE.
A new mechanism of signal path charging damage across separated power domain deep N-Well interface. [link]Link  A new mechanism of signal path charging damage across separated power domain deep N-Well interface. [link]Paper  bibtex   
@inproceedings{conf/irps/ChuKHTWCKW18,
  added-at = {2019-01-22T00:00:00.000+0100},
  author = {Chu, Yu-Lin and Kuo, Hsi-Yu and Hsu, Sheng-Fu and Tsai, Yung-Sheng and Wang, Ming-Yi and Chang, Chuan-Li and Kiang, Bill and Wu, Kenneth},
  biburl = {https://www.bibsonomy.org/bibtex/20a508422808868f999b9212b1135e448/dblp},
  booktitle = {IRPS},
  crossref = {conf/irps/2018},
  ee = {https://doi.org/10.1109/IRPS.2018.8353631},
  interhash = {2fe5fc3faff8cb6bd529e392b9144298},
  intrahash = {0a508422808868f999b9212b1135e448},
  isbn = {978-1-5386-5479-8},
  keywords = {dblp},
  pages = 6,
  publisher = {IEEE},
  timestamp = {2019-10-17T14:45:36.000+0200},
  title = {A new mechanism of signal path charging damage across separated power domain deep N-Well interface.},
  url = {http://dblp.uni-trier.de/db/conf/irps/irps2018.html#ChuKHTWCKW18},
  year = 2018
}

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