Fault-tolerance considerations for redundant binary-tree-dynamic random-access-memory (RAM) chips. Ciciani, B. IEEE transactions on reliability, 41(1):139–148, IEEE, 1992.
bibtex   
@article{Cic92d,
	title={Fault-tolerance considerations for redundant binary-tree-dynamic random-access-memory (RAM) chips},
	author={Ciciani, Bruno},
	journal={IEEE transactions on reliability},
	volume={41},
	number={1},
	pages={139--148},
	year={1992},
	publisher={IEEE}
}

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