Surface determination through atomically resolved secondary-electron imaging. Ciston, J., Brown, H. G., D’Alfonso, A. J., Koirala, P., Ophus, C., Lin, Y., Suzuki, Y., Inada, H., Zhu, Y., Allen, L. J., & Marks, L. D. Nature Communications, 6(1):7358, June, 2015. Number: 1 Publisher: Nature Publishing Group![Surface determination through atomically resolved secondary-electron imaging [link]](https://bibbase.org/img/filetypes/link.svg "link")
Paper doi abstract bibtex Unique determination of the atomic structure of technologically relevant surfaces is often limited by both a need for homogeneous crystals and ambiguity of registration between the surface and bulk. Atomically resolved secondary-electron imaging is extremely sensitive to this registration and is compatible with faceted nanomaterials, but has not been previously utilized for surface structure determination. Here we report a detailed experimental atomic-resolution secondary-electron microscopy analysis of the c(6 × 2) reconstruction on strontium titanate (001) coupled with careful simulation of secondary-electron images, density functional theory calculations and surface monolayer-sensitive aberration-corrected plan-view high-resolution transmission electron microscopy. Our work reveals several unexpected findings, including an amended registry of the surface on the bulk and strontium atoms with unusual seven-fold coordination within a typically high surface coverage of square pyramidal TiO5 units. Dielectric screening is found to play a critical role in attenuating secondary-electron generation processes from valence orbitals.
@article{ciston_surface_2015,
title = {Surface determination through atomically resolved secondary-electron imaging},
volume = {6},
copyright = {2015 The Author(s)},
issn = {2041-1723},
url = {https://www.nature.com/articles/ncomms8358},
doi = {10.1038/ncomms8358},
abstract = {Unique determination of the atomic structure of technologically relevant surfaces is often limited by both a need for homogeneous crystals and ambiguity of registration between the surface and bulk. Atomically resolved secondary-electron imaging is extremely sensitive to this registration and is compatible with faceted nanomaterials, but has not been previously utilized for surface structure determination. Here we report a detailed experimental atomic-resolution secondary-electron microscopy analysis of the c(6 × 2) reconstruction on strontium titanate (001) coupled with careful simulation of secondary-electron images, density functional theory calculations and surface monolayer-sensitive aberration-corrected plan-view high-resolution transmission electron microscopy. Our work reveals several unexpected findings, including an amended registry of the surface on the bulk and strontium atoms with unusual seven-fold coordination within a typically high surface coverage of square pyramidal TiO5 units. Dielectric screening is found to play a critical role in attenuating secondary-electron generation processes from valence orbitals.},
language = {en},
number = {1},
urldate = {2022-03-02},
journal = {Nature Communications},
author = {Ciston, J. and Brown, H. G. and D’Alfonso, A. J. and Koirala, P. and Ophus, C. and Lin, Y. and Suzuki, Y. and Inada, H. and Zhu, Y. and Allen, L. J. and Marks, L. D.},
month = jun,
year = {2015},
note = {Number: 1
Publisher: Nature Publishing Group},
keywords = {Applied physics, Microscopy, Surface chemistry},
pages = {7358},
}
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