Analysis of large system black-box test data. Clapp, K. C., Iyer, R. K., & Levendel, Y. H. In Third International Symposium on Software Reliability Engineering, ISSRE 1992, Research Triangle Park, NC, USA, October 7-10, 1992, pages 94–103, 1992.
Analysis of large system black-box test data [link]Paper  doi  bibtex   
@inproceedings{DBLP:conf/issre/ClappIL92,
  author    = {Kent C. Clapp and
               Ravishankar K. Iyer and
               Ytzhak H. Levendel},
  title     = {Analysis of large system black-box test data},
  booktitle = {Third International Symposium on Software Reliability Engineering,
               {ISSRE} 1992, Research Triangle Park, NC, USA, October 7-10, 1992},
  pages     = {94--103},
  year      = {1992},
  crossref  = {DBLP:conf/issre/1992},
  url       = {https://doi.org/10.1109/ISSRE.1992.285854},
  doi       = {10.1109/ISSRE.1992.285854},
  timestamp = {Wed, 13 Feb 2019 11:42:23 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/issre/ClappIL92},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}

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