@article{304,
  author = {Zachary A. Collier and Davis C. Loose and Elvie Sellers and Thomas L. Polmateer and Madhur Behl and Igor Linkov and James H. Lambert},
  title = {Stress Testing for Resilience of Semiconductor Supply Chains},
  year = {2023},
  journal = {Unknown Journal},
  url = {https://doi.org/10.1109/uemcon59035.2023.10315988}
}

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