@article{304,
  author = {Zachary A. Collier and Davis C. Loose and Elvie Sellers and Thomas L. Polmateer and Madhur Behl and Igor Linkov and James H. Lambert},
  title = {Stress Testing for Resilience of Semiconductor Supply Chains},
  year = {2023},
  journal = {Unknown Journal},
  url = {https://doi.org/10.1109/uemcon59035.2023.10315988}
}

{"_id":"j2WWmJXEbwADJqJiq","bibbaseid":"collier-loose-sellers-polmateer-behl-linkov-lambert-stresstestingforresilienceofsemiconductorsupplychains-2023","author_short":["Collier, Z. A.","Loose, D. C.","Sellers, E.","Polmateer, T. L.","Behl, M.","Linkov, I.","Lambert, J. H."],"bibdata":{"bibtype":"article","type":"article","author":[{"firstnames":["Zachary","A."],"propositions":[],"lastnames":["Collier"],"suffixes":[]},{"firstnames":["Davis","C."],"propositions":[],"lastnames":["Loose"],"suffixes":[]},{"firstnames":["Elvie"],"propositions":[],"lastnames":["Sellers"],"suffixes":[]},{"firstnames":["Thomas","L."],"propositions":[],"lastnames":["Polmateer"],"suffixes":[]},{"firstnames":["Madhur"],"propositions":[],"lastnames":["Behl"],"suffixes":[]},{"firstnames":["Igor"],"propositions":[],"lastnames":["Linkov"],"suffixes":[]},{"firstnames":["James","H."],"propositions":[],"lastnames":["Lambert"],"suffixes":[]}],"title":"Stress Testing for Resilience of Semiconductor Supply Chains","year":"2023","journal":"Unknown Journal","url":"https://doi.org/10.1109/uemcon59035.2023.10315988","bibtex":"@article{304,\n author = {Zachary A. Collier and Davis C. Loose and Elvie Sellers and Thomas L. Polmateer and Madhur Behl and Igor Linkov and James H. Lambert},\n title = {Stress Testing for Resilience of Semiconductor Supply Chains},\n year = {2023},\n journal = {Unknown Journal},\n url = {https://doi.org/10.1109/uemcon59035.2023.10315988}\n}\n\n","author_short":["Collier, Z. A.","Loose, D. C.","Sellers, E.","Polmateer, T. L.","Behl, M.","Linkov, I.","Lambert, J. H."],"key":"304","id":"304","bibbaseid":"collier-loose-sellers-polmateer-behl-linkov-lambert-stresstestingforresilienceofsemiconductorsupplychains-2023","role":"author","urls":{"Paper":"https://doi.org/10.1109/uemcon59035.2023.10315988"},"metadata":{"authorlinks":{}}},"bibtype":"article","biburl":"https://bibbase.org/f/fFERMKNwKyHLsDPJ3/Link_Lab_Publications.bib","dataSources":["BT3X3GwZkCpNDfran","wjuM2yjE6FYvwqbTY","oMqgPf8XFXWogdmsL","DesgNCELw9F4LSokr","79k4a9RPj7eHbc3Qj","JSGNr3KwokFPgXiz5","RbCkvcfqfbgtxTyNT","mwAui9iKniQyhTc49"],"keywords":[],"search_terms":["stress","testing","resilience","semiconductor","supply","chains","collier","loose","sellers","polmateer","behl","linkov","lambert"],"title":"Stress Testing for Resilience of Semiconductor Supply Chains","year":2023}