Understanding information system success model and valence framework in sellers' acceptance of cross-border e-commerce: a sequential multi-method approach. Cui, Y., Mou, J., Cohen, J. F., & Liu, Y. Electron. Commer. Res., 19(4):885-914, 2019.
Understanding information system success model and valence framework in sellers' acceptance of cross-border e-commerce: a sequential multi-method approach. [link]Link  Understanding information system success model and valence framework in sellers' acceptance of cross-border e-commerce: a sequential multi-method approach. [link]Paper  bibtex   
@article{journals/ecr/CuiMCL19,
  added-at = {2025-01-19T00:00:00.000+0100},
  author = {Cui, Yi and Mou, Jian and Cohen, Jason F. and Liu, Yanping},
  biburl = {https://www.bibsonomy.org/bibtex/20627ce54f0f3cf8951a9e81ede5b01ce/dblp},
  ee = {https://www.wikidata.org/entity/Q128535335},
  interhash = {a5e71dd634674da715ea137e6670a6db},
  intrahash = {0627ce54f0f3cf8951a9e81ede5b01ce},
  journal = {Electron. Commer. Res.},
  keywords = {dblp},
  number = 4,
  pages = {885-914},
  timestamp = {2025-01-27T08:29:31.000+0100},
  title = {Understanding information system success model and valence framework in sellers' acceptance of cross-border e-commerce: a sequential multi-method approach.},
  url = {http://dblp.uni-trier.de/db/journals/ecr/ecr19.html#CuiMCL19},
  volume = 19,
  year = 2019
}

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