A review of electrical and thermal multistress aging models. Cygan, P. & Laghari, J. In International Symposium on Electrical Insulation, pages 15–20, June, 1990.
doi  bibtex   
@InProceedings{   Cygan_1990aa,
  author        = {Cygan, P. and Laghari, J.R.},
  booktitle     = {International Symposium on Electrical Insulation},
  citable       = {1},
  doi           = {10.1109/ELINSL.1990.109698},
  file          = {Cygan_1990aa.pdf},
  group         = {casper},
  internal      = {0},
  issn          = {1089-084X},
  keywords      = {aging,reliability,electrothermal,thermal stress},
  langid        = {english},
  month         = jun,
  pages         = {15--20},
  title         = {A review of electrical and thermal multistress aging models},
  year          = {1990}
}

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