@inproceedings{DeAngelis2004,
address = {Notre Dame, Indiana},
author = {DeAngelis, David and Okojie, Robert},
booktitle = {The TMS 46th Electronic Materials Conference (EMC 2004)},
file = {:home/dave/Documents/References/DeAngelis, Okojie - 2004 - In-Situ Characterization of Ohmic Contacts to N-Type SiC Under High Temperature and Current.pdf:pdf},
title = {In-Situ Characterization of Ohmic Contacts to N-Type SiC Under High Temperature and Current},
url = {https://www.tms.org/Meetings/Specialty/EMC04/EMC04-pdfs.html},
year = {2004}
}

{"_id":"JKxnYqAvXcRhCaYCf","bibbaseid":"deangelis-okojie-insitucharacterizationofohmiccontactstontypesicunderhightemperatureandcurrent-2004","author_short":["DeAngelis, D.","Okojie, R."],"bibdata":{"bibtype":"inproceedings","type":"inproceedings","address":"Notre Dame, Indiana","author":[{"propositions":[],"lastnames":["DeAngelis"],"firstnames":["David"],"suffixes":[]},{"propositions":[],"lastnames":["Okojie"],"firstnames":["Robert"],"suffixes":[]}],"booktitle":"The TMS 46th Electronic Materials Conference (EMC 2004)","file":":home/dave/Documents/References/DeAngelis, Okojie - 2004 - In-Situ Characterization of Ohmic Contacts to N-Type SiC Under High Temperature and Current.pdf:pdf","title":"In-Situ Characterization of Ohmic Contacts to N-Type SiC Under High Temperature and Current","url":"https://www.tms.org/Meetings/Specialty/EMC04/EMC04-pdfs.html","year":"2004","bibtex":"@inproceedings{DeAngelis2004,\naddress = {Notre Dame, Indiana},\nauthor = {DeAngelis, David and Okojie, Robert},\nbooktitle = {The TMS 46th Electronic Materials Conference (EMC 2004)},\nfile = {:home/dave/Documents/References/DeAngelis, Okojie - 2004 - In-Situ Characterization of Ohmic Contacts to N-Type SiC Under High Temperature and Current.pdf:pdf},\ntitle = {In-Situ Characterization of Ohmic Contacts to N-Type SiC Under High Temperature and Current},\nurl = {https://www.tms.org/Meetings/Specialty/EMC04/EMC04-pdfs.html},\nyear = {2004}\n}\n","author_short":["DeAngelis, D.","Okojie, R."],"bibbaseid":"deangelis-okojie-insitucharacterizationofohmiccontactstontypesicunderhightemperatureandcurrent-2004","role":"author","urls":{"Paper":"https://www.tms.org/Meetings/Specialty/EMC04/EMC04-pdfs.html"},"metadata":{"authorlinks":{}}},"bibtype":"inproceedings","biburl":"https://bibbase.org/f/7SuybTZdWsB7xvF7g/deangeli.bib","dataSources":["M7ziDRZgTdncfb9v6"],"keywords":[],"search_terms":["situ","characterization","ohmic","contacts","type","sic","under","high","temperature","current","deangelis","okojie"],"title":"In-Situ Characterization of Ohmic Contacts to N-Type SiC Under High Temperature and Current","year":2004}