Functional analysis of circuits under timing variations. Dehbashi, M., Fey, G., Roy, K., & Raghunathan, A. In 17th IEEE European Test Symposium, ETS 2012, Annecy, France, May 28 - June 1 2012, pages 1, 2012. Paper doi bibtex @inproceedings{DBLP:conf/ets/DehbashiFRR12,
author = {Mehdi Dehbashi and
G{\"{o}}rschwin Fey and
Kaushik Roy and
Anand Raghunathan},
title = {Functional analysis of circuits under timing variations},
booktitle = {17th {IEEE} European Test Symposium, {ETS} 2012, Annecy, France, May
28 - June 1 2012},
pages = {1},
year = {2012},
crossref = {DBLP:conf/ets/2012},
url = {https://doi.org/10.1109/ETS.2012.6233031},
doi = {10.1109/ETS.2012.6233031},
timestamp = {Fri, 02 Jun 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/bib/conf/ets/DehbashiFRR12},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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