Functional analysis of circuits under timing variations. Dehbashi, M., Fey, G., Roy, K., & Raghunathan, A. In 17th IEEE European Test Symposium, ETS 2012, Annecy, France, May 28 - June 1 2012, pages 1, 2012.
Functional analysis of circuits under timing variations [link]Paper  doi  bibtex   
@inproceedings{DBLP:conf/ets/DehbashiFRR12,
  author    = {Mehdi Dehbashi and
               G{\"{o}}rschwin Fey and
               Kaushik Roy and
               Anand Raghunathan},
  title     = {Functional analysis of circuits under timing variations},
  booktitle = {17th {IEEE} European Test Symposium, {ETS} 2012, Annecy, France, May
               28 - June 1 2012},
  pages     = {1},
  year      = {2012},
  crossref  = {DBLP:conf/ets/2012},
  url       = {https://doi.org/10.1109/ETS.2012.6233031},
  doi       = {10.1109/ETS.2012.6233031},
  timestamp = {Fri, 02 Jun 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/ets/DehbashiFRR12},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}

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