An Approach to Locate Parametric Faults in Nonlinear Analog Circuits. Deng, Y., Shi, Y., & Zhang, W. IEEE T. Instrumentation and Measurement (TIM), 61(2):358-367, 2012.
An Approach to Locate Parametric Faults in Nonlinear Analog Circuits [link]Paper  bibtex   
@article{ dblp2328567,
  title = {An Approach to Locate Parametric Faults in Nonlinear Analog Circuits},
  author = {Yong Deng and Yibing Shi and Wei Zhang},
  author_short = {Deng, Y. and Shi, Y. and Zhang, W.},
  bibtype = {article},
  type = {article},
  year = {2012},
  key = {dblp2328567},
  id = {dblp2328567},
  biburl = {http://www.dblp.org/rec/bibtex/journals/tim/DengSZ12},
  url = {http://dx.doi.org/10.1109/TIM.2011.2161930},
  journal = {IEEE T. Instrumentation and Measurement (TIM)},
  pages = {358-367},
  number = {2},
  volume = {61},
  text = {IEEE T. Instrumentation and Measurement (TIM) 61(2):358-367 (2012)}
}

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