An Approach to Locate Parametric Faults in Nonlinear Analog Circuits. Deng, Y., Shi, Y., & Zhang, W. IEEE T. Instrumentation and Measurement (TIM), 61(2):358-367, 2012. Paper bibtex @article{ dblp2328567,
title = {An Approach to Locate Parametric Faults in Nonlinear Analog Circuits},
author = {Yong Deng and Yibing Shi and Wei Zhang},
author_short = {Deng, Y. and Shi, Y. and Zhang, W.},
bibtype = {article},
type = {article},
year = {2012},
key = {dblp2328567},
id = {dblp2328567},
biburl = {http://www.dblp.org/rec/bibtex/journals/tim/DengSZ12},
url = {http://dx.doi.org/10.1109/TIM.2011.2161930},
journal = {IEEE T. Instrumentation and Measurement (TIM)},
pages = {358-367},
number = {2},
volume = {61},
text = {IEEE T. Instrumentation and Measurement (TIM) 61(2):358-367 (2012)}
}
Downloads: 0
{"_id":"7rgo5F2HNZnkBY46o","bibbaseid":"deng-shi-zhang-anapproachtolocateparametricfaultsinnonlinearanalogcircuits-2012","downloads":0,"creationDate":"2015-09-08T15:41:49.636Z","title":"An Approach to Locate Parametric Faults in Nonlinear Analog Circuits","author_short":["Deng, Y.","Shi, Y.","Zhang, W."],"year":2012,"bibtype":"article","biburl":"http://www.dblp.org/rec/bibtex/journals/tim/DengSZ12","bibdata":{"title":"An Approach to Locate Parametric Faults in Nonlinear Analog Circuits","author":["Yong Deng","Yibing Shi","Wei Zhang"],"author_short":["Deng, Y.","Shi, Y.","Zhang, W."],"bibtype":"article","type":"article","year":"2012","key":"dblp2328567","id":"dblp2328567","biburl":"http://www.dblp.org/rec/bibtex/journals/tim/DengSZ12","url":"http://dx.doi.org/10.1109/TIM.2011.2161930","journal":"IEEE T. Instrumentation and Measurement (TIM)","pages":"358-367","number":"2","volume":"61","text":"IEEE T. Instrumentation and Measurement (TIM) 61(2):358-367 (2012)","bibtex":"@article{ dblp2328567,\n title = {An Approach to Locate Parametric Faults in Nonlinear Analog Circuits},\n author = {Yong Deng and Yibing Shi and Wei Zhang},\n author_short = {Deng, Y. and Shi, Y. and Zhang, W.},\n bibtype = {article},\n type = {article},\n year = {2012},\n key = {dblp2328567},\n id = {dblp2328567},\n biburl = {http://www.dblp.org/rec/bibtex/journals/tim/DengSZ12},\n url = {http://dx.doi.org/10.1109/TIM.2011.2161930},\n journal = {IEEE T. Instrumentation and Measurement (TIM)},\n pages = {358-367},\n number = {2},\n volume = {61},\n text = {IEEE T. Instrumentation and Measurement (TIM) 61(2):358-367 (2012)}\n}","bibbaseid":"deng-shi-zhang-anapproachtolocateparametricfaultsinnonlinearanalogcircuits-2012","role":"author","urls":{"Paper":"http://dx.doi.org/10.1109/TIM.2011.2161930"},"downloads":0},"search_terms":["approach","locate","parametric","faults","nonlinear","analog","circuits","deng","shi","zhang"],"keywords":[],"authorIDs":[],"dataSources":["7kmPMSyLm9iqx68L5"]}