1+1>2: variation-aware lifetime enhancement for embedded 3D NAND flash systems. Di, Y., Shi, L., Chen, S., Xue, C. J., & Sha, E. H. In Chen, J. & Shrivastava, A., editors, LCTES, pages 45-56, 2019. ACM.
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Paper bibtex @inproceedings{conf/lctrts/DiSCXS19,
added-at = {2025-01-19T00:00:00.000+0100},
author = {Di, Yejia and Shi, Liang and Chen, Shuo-Han and Xue, Chun Jason and Sha, Edwin Hsing-Mean},
biburl = {https://www.bibsonomy.org/bibtex/2e44b512641790f6248367a23ee7ea245/dblp},
booktitle = {LCTES},
crossref = {conf/lctrts/2019},
editor = {Chen, Jian-Jia and Shrivastava, Aviral},
ee = {https://www.wikidata.org/entity/Q130844601},
interhash = {29e8b2f2648ec101d5df1dca9dc61a35},
intrahash = {e44b512641790f6248367a23ee7ea245},
isbn = {978-1-4503-6724-0},
keywords = {dblp},
pages = {45-56},
publisher = {ACM},
timestamp = {2025-01-27T11:03:59.000+0100},
title = {1+1>2: variation-aware lifetime enhancement for embedded 3D NAND flash systems.},
url = {http://dblp.uni-trier.de/db/conf/lctrts/lctes2019.html#DiSCXS19},
year = 2019
}
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