1+1>2: variation-aware lifetime enhancement for embedded 3D NAND flash systems. Di, Y., Shi, L., Chen, S., Xue, C. J., & Sha, E. H. In Chen, J. & Shrivastava, A., editors, LCTES, pages 45-56, 2019. ACM.
1+1>2: variation-aware lifetime enhancement for embedded 3D NAND flash systems. [link]Link  1+1>2: variation-aware lifetime enhancement for embedded 3D NAND flash systems. [link]Paper  bibtex   
@inproceedings{conf/lctrts/DiSCXS19,
  added-at = {2025-01-19T00:00:00.000+0100},
  author = {Di, Yejia and Shi, Liang and Chen, Shuo-Han and Xue, Chun Jason and Sha, Edwin Hsing-Mean},
  biburl = {https://www.bibsonomy.org/bibtex/2e44b512641790f6248367a23ee7ea245/dblp},
  booktitle = {LCTES},
  crossref = {conf/lctrts/2019},
  editor = {Chen, Jian-Jia and Shrivastava, Aviral},
  ee = {https://www.wikidata.org/entity/Q130844601},
  interhash = {29e8b2f2648ec101d5df1dca9dc61a35},
  intrahash = {e44b512641790f6248367a23ee7ea245},
  isbn = {978-1-4503-6724-0},
  keywords = {dblp},
  pages = {45-56},
  publisher = {ACM},
  timestamp = {2025-01-27T11:03:59.000+0100},
  title = {1+1>2: variation-aware lifetime enhancement for embedded 3D NAND flash systems.},
  url = {http://dblp.uni-trier.de/db/conf/lctrts/lctes2019.html#DiSCXS19},
  year = 2019
}

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