Computer simulation of SEM electron beam induced current images of dislocations and stacking faults. Donolato, C. & Klann, H. Journal of Applied Physics, 51(3):1624–1633, March, 1980. Publisher: American Institute of Physics
Computer simulation of SEM electron beam induced current images of dislocations and stacking faults [link]Paper  doi  bibtex   
@article{donolato_computer_1980,
	title = {Computer simulation of {SEM} electron beam induced current images of dislocations and stacking faults},
	volume = {51},
	issn = {0021-8979},
	url = {https://aip.scitation.org/doi/abs/10.1063/1.327767},
	doi = {10.1063/1.327767},
	number = {3},
	urldate = {2022-01-13},
	journal = {Journal of Applied Physics},
	author = {Donolato, C. and Klann, H.},
	month = mar,
	year = {1980},
	note = {Publisher: American Institute of Physics},
	pages = {1624--1633},
}

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