Dielectric Constant, Loss Tangent, and Surface-Roughness Loss Characterization of Ceramic Substrates. Dsilva, H. & Engin, A. E. In IMAPS/ACerS International Conference and Exhibition on Ceramic Interconnect and Ceramic Microsystems Technologies (CICMT),, apr., 2014. bibtex @INPROCEEDINGS{engin_cicmt14,
author={Dsilva, Hansel and Engin, A. Ege},
booktitle={{IMAPS/ACerS} International Conference and Exhibition on Ceramic Interconnect and Ceramic Microsystems Technologies {(CICMT)},}, title={Dielectric Constant, Loss Tangent, and Surface-Roughness Loss Characterization of Ceramic Substrates},
year={2014},
month={apr.},
ISSN={},}
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