Dielectric Constant, Loss Tangent, and Surface-Roughness Loss Characterization of Ceramic Substrates. Dsilva, H. and Engin, A. E. In IMAPS/ACerS International Conference and Exhibition on Ceramic Interconnect and Ceramic Microsystems Technologies (CICMT),, apr., 2014.
bibtex   
@INPROCEEDINGS{engin_cicmt14, 
author={Dsilva, Hansel and Engin, A. Ege}, 
booktitle={{IMAPS/ACerS} International Conference and Exhibition on Ceramic Interconnect and Ceramic Microsystems Technologies {(CICMT)},}, title={Dielectric Constant, Loss Tangent, and Surface-Roughness Loss Characterization of Ceramic Substrates}, 
year={2014}, 
month={apr.}, 
ISSN={},}
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