Signature Matching Using Supervised Topic Models. Du, X.; Doermann, D.; and Abd-Almageed, W. In 2014 22ⁿᵈ International Conference on Pattern Recognition, pages 327–332, 2014. IEEE.
bibtex   
@InProceedings{Du2014,
  author    = {Du, Xianzhi and Doermann, David and Abd-Almageed, Wael},
  booktitle = {2014 22ⁿᵈ International Conference on Pattern Recognition},
  title     = {Signature Matching Using Supervised Topic Models},
  year      = {2014},
  pages     = {327--332},
  publisher = {IEEE},
}
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