Proceedings of the International Conference on Measurements and Modeling of Computer Systems, SIGMETRICS 2005, June 6-10, 2005, Banff, Alberta, Canada

Proceedings of the International Conference on Measurements and Modeling of Computer Systems, SIGMETRICS 2005, June 6-10, 2005, Banff, Alberta, Canada. Eager, D. L., Williamson, C. L., Borst, S. C., & Lui, J. C. S., editors Volume ACM. 2005.

Paper doi bibtex

@proceedings{DBLP:conf/sigmetrics/2005,
  editor    = {Derek L. Eager and
               Carey L. Williamson and
               Sem C. Borst and
               John C. S. Lui},
  title     = {Proceedings of the International Conference on Measurements and Modeling
               of Computer Systems, {SIGMETRICS} 2005, June 6-10, 2005, Banff, Alberta,
               Canada},
  publisher = {{ACM}},
  year      = {2005},
  url       = {https://doi.org/10.1145/1064212},
  doi       = {10.1145/1064212},
  isbn      = {1-59593-022-1},
  timestamp = {Tue, 06 Nov 2018 11:07:17 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/sigmetrics/2005},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}

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