Intermetallic phase formation during annealing of Al/Ni multilayers

Intermetallic phase formation during annealing of Al/Ni multilayers. Edelstein, A., S., Everett, R., K., Richardson, G., Y., Qadri, S., B., Altman, E., I., Foley, J., C., & Perepezko, J., H. Technical Report 1994.

Paper abstract bibtex

The phase evolution during annealing of Al/Ni multilayer samples prepared by ion‐beam sputtering with composition modulation wavelengths Λ between 10 and 400 nm was determined using x‐ray diffraction and differential scanning calorimeter measurements. Samples with average compositions of Al0.40 Ni 0.60 and Al0.75 Ni 0.25 were investigated. For the Al0.40 Ni 0.60 samples the following results were obtained. A measure of the degree of periodicity and the sharpness of the interfaces in a sample with Λ=80 nm was the large number (over 20) of peaks observed in small‐angle x‐ray scattering measurements. A sample with Λ=10 nm was transformed by heat treatment directly to the AlNi phase. In the Λ=80 nm sample, the first phase formed after annealing was the metastable η phase. The η phase was identified as Al9 Ni 2. In the 400 nm wavelength sample, both the metastable η phase and the stable Al3 Ni formed after the first exothermic reaction. For the Al0.75 Ni 0.25 samples two results were obtained. A Λ=11.4 nm sample transformed directly on annealing into Al3 Ni. The η phase was the first phase formed on annealing a Λ=100 nm sample. The difference in the component diffusivities and the concentration gradient play an important role in controlling phase formation and evolution.

@techreport{
 title = {Intermetallic phase formation during annealing of Al/Ni multilayers},
 type = {techreport},
 year = {1994},
 source = {Journal of Applied Physics},
 identifiers = {[object Object]},
 keywords = {ALUMINIUM,ANNEALING,CALORIMETRY,INTERFACE STRUCTURE,METASTABLE PHASES,MULTILAYERS,NICKEL,PHASE STUDIES,SPUTTERED MATERIALS,XRD},
 pages = {7850-7859},
 volume = {76},
 issue = {12},
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 created = {2018-09-14T20:50:22.334Z},
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 abstract = {The phase evolution during annealing of Al/Ni multilayer samples prepared by ion‐beam sputtering with composition modulation wavelengths Λ between 10 and 400 nm was determined using x‐ray diffraction and differential scanning calorimeter measurements. Samples with average compositions of Al0.40 Ni 0.60 and Al0.75 Ni 0.25 were investigated. For the Al0.40 Ni 0.60 samples the following results were obtained. A measure of the degree of periodicity and the sharpness of the interfaces in a sample with Λ=80 nm was the large number (over 20) of peaks observed in small‐angle x‐ray scattering measurements. A sample with Λ=10 nm was transformed by heat treatment directly to the AlNi phase. In the Λ=80 nm sample, the first phase formed after annealing was the metastable η phase. The η phase was identified as Al9 Ni 2. In the 400 nm wavelength sample, both the metastable η phase and the stable Al3 Ni formed after the first exothermic reaction. For the Al0.75 Ni 0.25 samples two results were obtained. A Λ=11.4 nm sample transformed directly on annealing into Al3 Ni. The η phase was the first phase formed on annealing a Λ=100 nm sample. The difference in the component diffusivities and the concentration gradient play an important role in controlling phase formation and evolution.},
 bibtype = {techreport},
 author = {Edelstein, A. S. and Everett, R. K. and Richardson, G. Y. and Qadri, S. B. and Altman, E. I. and Foley, J. C. and Perepezko, J. H.}
}

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