Using Clustering to Learn Distance Functions for Supervised Similarity Assessment. Eick, C. F., Rouhana, A., Bagherjeiran, A., & Vilalta, R. In Perner, P. & Imiya, A., editors, Machine Learning and Data Mining in Pattern Recognition, 4th International Conference, MLDM 2005, Leipzig, Germany, July 9-11, 2005, Proceedings, volume 3587, of Lecture Notes in Computer Science, pages 120–131, 2005. Springer.
Using Clustering to Learn Distance Functions for Supervised Similarity Assessment [link]Paper  doi  bibtex   
@inproceedings{DBLP:conf/mldm/EickRBV05,
  author    = {Christoph F. Eick and
               Alain Rouhana and
               Abraham Bagherjeiran and
               Ricardo Vilalta},
  editor    = {Petra Perner and
               Atsushi Imiya},
  title     = {Using Clustering to Learn Distance Functions for Supervised Similarity
               Assessment},
  booktitle = {Machine Learning and Data Mining in Pattern Recognition, 4th International
               Conference, {MLDM} 2005, Leipzig, Germany, July 9-11, 2005, Proceedings},
  series    = {Lecture Notes in Computer Science},
  volume    = {3587},
  pages     = {120--131},
  publisher = {Springer},
  year      = {2005},
  url       = {https://doi.org/10.1007/11510888\_13},
  doi       = {10.1007/11510888\_13},
  timestamp = {Tue, 14 May 2019 10:00:53 +0200},
  biburl    = {https://dblp.org/rec/conf/mldm/EickRBV05.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}

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