Using Clustering to Learn Distance Functions for Supervised Similarity Assessment. Eick, C. F., Rouhana, A., Bagherjeiran, A., & Vilalta, R. In Perner, P. & Imiya, A., editors, Machine Learning and Data Mining in Pattern Recognition, 4th International Conference, MLDM 2005, Leipzig, Germany, July 9-11, 2005, Proceedings, volume 3587, of Lecture Notes in Computer Science, pages 120–131, 2005. Springer. Paper doi bibtex @inproceedings{DBLP:conf/mldm/EickRBV05,
author = {Christoph F. Eick and
Alain Rouhana and
Abraham Bagherjeiran and
Ricardo Vilalta},
editor = {Petra Perner and
Atsushi Imiya},
title = {Using Clustering to Learn Distance Functions for Supervised Similarity
Assessment},
booktitle = {Machine Learning and Data Mining in Pattern Recognition, 4th International
Conference, {MLDM} 2005, Leipzig, Germany, July 9-11, 2005, Proceedings},
series = {Lecture Notes in Computer Science},
volume = {3587},
pages = {120--131},
publisher = {Springer},
year = {2005},
url = {https://doi.org/10.1007/11510888\_13},
doi = {10.1007/11510888\_13},
timestamp = {Tue, 14 May 2019 10:00:53 +0200},
biburl = {https://dblp.org/rec/conf/mldm/EickRBV05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
Downloads: 0
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