Specification of a Bounded Exhaustive Testing Study for a Software-based Embedded Digital Device. Elks, C., Deloglos, C., Tantawy, D. A., Hite, R., Guatham, S., & Jayakumar, A. Technical Report INL/EXT-18-52032, U.S. Department of Energy, Office of Nuclear Energy, November, 2018.
bibtex   
@techreport{elks_specification_2018,
	address = {Office of Nuclear Energy},
	type = {Technical {Report}},
	title = {Specification of a {Bounded} {Exhaustive} {Testing} {Study} for a {Software}-based {Embedded} {Digital} {Device}},
	language = {en},
	number = {INL/EXT-18-52032},
	institution = {U.S. Department of Energy},
	author = {Elks, Carl and Deloglos, Christopher and Tantawy, Dr Ashraf and Hite, Rick and Guatham, Smitha and Jayakumar, Athira},
	month = nov,
	year = {2018},
	pages = {38},
}

Downloads: 0