Specification of a Bounded Exhaustive Testing Study for a Software-based Embedded Digital Device. Elks, C., Deloglos, C., Tantawy, D. A., Hite, R., Guatham, S., & Jayakumar, A. Technical Report INL/EXT-18-52032, U.S. Department of Energy, Office of Nuclear Energy, November, 2018. bibtex @techreport{elks_specification_2018,
address = {Office of Nuclear Energy},
type = {Technical {Report}},
title = {Specification of a {Bounded} {Exhaustive} {Testing} {Study} for a {Software}-based {Embedded} {Digital} {Device}},
language = {en},
number = {INL/EXT-18-52032},
institution = {U.S. Department of Energy},
author = {Elks, Carl and Deloglos, Christopher and Tantawy, Dr Ashraf and Hite, Rick and Guatham, Smitha and Jayakumar, Athira},
month = nov,
year = {2018},
pages = {38},
}
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