@inproceedings{conf/ats/ElShoukryTR05,
  added-at = {2016-01-13T00:00:00.000+0100},
  author = {ElShoukry, Mohammed and Tehranipoor, Mohammad and Ravikumar, C. P.},
  biburl = {http://www.bibsonomy.org/bibtex/2f0fe2447413e7c81a9f7937af2199cf7/dblp},
  booktitle = {Asian Test Symposium},
  crossref = {conf/ats/2005},
  ee = {http://doi.ieeecomputersociety.org/10.1109/ATS.2005.87},
  interhash = {e7db0f57bdf7bdeae8903f19c1e40897},
  intrahash = {f0fe2447413e7c81a9f7937af2199cf7},
  isbn = {0-7695-2481-8},
  keywords = {dblp},
  pages = {242-247},
  publisher = {IEEE Computer Society},
  timestamp = {2016-01-15T11:38:31.000+0100},
  title = {Partial Gating Optimization for Power Reduction During Test Application.},
  url = {http://dblp.uni-trier.de/db/conf/ats/ats2005.html#ElShoukryTR05},
  year = 2005
}

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