Thermal reaction and stability of NiFe/Cu thin films investigated by atom probe tomography. Ene, C. B., Schmitz, G., Kirchheim, R., & Hütten, A. Surface and Interface Analysis, 39:227–231, Wiley, 2007. Paper doi bibtex @article{10.1002/sia.2519,
doi = {10.1002/sia.2519},
url = {http://dx.doi.org/10.1002/sia.2519},
year = 2007,
publisher = {Wiley},
volume = {39},
pages = {227--231},
author = {C. B. Ene and G. Schmitz and R. Kirchheim and A. Hütten},
title = {Thermal reaction and stability of {NiFe}/Cu thin films investigated by atom probe tomography},
journal = {Surface and Interface Analysis}
}
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