@inproceedings{ cermak_microscopic_2014,
  address = {Brno, Czech Republic},
  title = {Microscopic Characterization of Graphene Electronic Quality Across Neighbouring, Differently Oriented Copper Grains},
  isbn = {978-80-87294-55-0},
  abstract = {Thermal chemical vapor deposition ({CVD}) is used to prepare graphene on thin copper foil used as catalytic,
large area substrate. High temperature (1000°C) during the {CVD} process causes re-crystallization of the
copper foil leading to granular structure with 10-100 m grains. After the {CVD}, optical microscopy shows
different coloring of the grains. We study graphene grown across the boundary of three such grains having
bright, medium, and dark color in reflection. Raman micro-spectroscopy proves presence of mostly a monoor
bi-layer graphene on all the grains. Yet intensity of Raman 2D band is grain-dependent: highest at the
darkest grain and lowest at the brightest one. Contrary, conductive atomic force microscopy detects the
highest conductivity at the brightest grain and the lowest current at the darkest grain. This is attributed to
dominant electrical current path through graphene and underlying oxide thickness of which also depends on
the type of copper grain. We correlate and discuss the results with view to better understanding of graphene
growth and electronic properties on large area copper substrates.},
  booktitle = {Nanocon 2014 proceedings},
  publisher = {Tanger Ltd. Ostrava},
  author = {Čermák, Jan and Yamada, Takatoshi and Ganzerová, Kristina and Rezek, Bohuslav},
  year = {2014},
  note = {00000}
}

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