On Using Machine Learning for Logic BIST. Fagot, C., Girard, P., & Landrault, C. In Proceedings of International Test Conference (ITC), pages 338-346, 1997. ![On Using Machine Learning for Logic BIST [link]](https://bibbase.org/img/filetypes/link.svg "link")
Paper bibtex @inproceedings{ dblp4103205,
title = {On Using Machine Learning for Logic BIST},
author = {Christophe Fagot and Patrick Girard and Christian Landrault},
author_short = {Fagot, C. and Girard, P. and Landrault, C.},
bibtype = {inproceedings},
type = {inproceedings},
year = {1997},
key = {dblp4103205},
id = {dblp4103205},
biburl = {http://www.dblp.org/rec/bibtex/conf/itc/FagotGL97},
url = {http://doi.ieeecomputersociety.org/10.1109/TEST.1997.639635},
conference = {ITC},
pages = {338-346},
text = {ITC 1997:338-346},
booktitle = {Proceedings of International Test Conference (ITC)}
}
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