A novel stuck-at based method for transistor stuck-open fault diagnosis. Fan, X., Moore, W. R., Hora, C., & Gronthoud, G. In ITC, pages 9, 2005. IEEE.
A novel stuck-at based method for transistor stuck-open fault diagnosis. [link]Link  A novel stuck-at based method for transistor stuck-open fault diagnosis. [link]Paper  bibtex   
@inproceedings{ conf/itc/FanMHG05,
  added-at = {2012-02-07T00:00:00.000+0100},
  author = {Fan, Xinyue and Moore, Will R. and Hora, Camelia and Gronthoud, Guido},
  biburl = {http://www.bibsonomy.org/bibtex/273c7f9ac52b7cfa936286e7577e68456/dblp},
  booktitle = {ITC},
  crossref = {conf/itc/2005},
  ee = {http://doi.ieeecomputersociety.org/10.1109/TEST.2005.1583996},
  interhash = {84385e4c55805da318392b9b689deaf8},
  intrahash = {73c7f9ac52b7cfa936286e7577e68456},
  isbn = {0-7803-9038-5},
  keywords = {dblp},
  pages = {9},
  publisher = {IEEE},
  title = {A novel stuck-at based method for transistor stuck-open fault diagnosis.},
  url = {http://dblp.uni-trier.de/db/conf/itc/itc2005.html#FanMHG05},
  year = {2005}
}

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