Stuck-open fault diagnosis with stuck-at model. Fan, X., Moore, W. R., Hora, C., & Gronthoud, G. In European Test Symposium, pages 182-187, 2005. IEEE.
Stuck-open fault diagnosis with stuck-at model. [link]Link  Stuck-open fault diagnosis with stuck-at model. [link]Paper  bibtex   
@inproceedings{ conf/ets/FanMHG05,
  added-at = {2013-08-20T00:00:00.000+0200},
  author = {Fan, Xinyue and Moore, Will R. and Hora, Camelia and Gronthoud, Guido},
  biburl = {http://www.bibsonomy.org/bibtex/26ad239e03b6d976d7098bf88a26da518/dblp},
  booktitle = {European Test Symposium},
  crossref = {conf/ets/2005},
  ee = {http://doi.ieeecomputersociety.org/10.1109/ETS.2005.35},
  interhash = {5d9730381b15290bd36b57cf2916ee13},
  intrahash = {6ad239e03b6d976d7098bf88a26da518},
  isbn = {0-7695-2341-2},
  keywords = {dblp},
  pages = {182-187},
  publisher = {IEEE},
  title = {Stuck-open fault diagnosis with stuck-at model.},
  url = {http://dblp.uni-trier.de/db/conf/ets/ets2005.html#FanMHG05},
  year = {2005}
}

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