@inproceedings{conf/ddecs/FarahaniASF13,
  author = {Farahani, Bahareh J. and Azarpeyvand, Ali and Safari, Saeed and Fakhraie, Seid Mehdi},
  booktitle = {DDECS},
  crossref = {conf/ddecs/2013},
  editor = {Sekanina, Lukás and Fey, Görschwin and Raik, Jaan and Aunet, Snorre and Ruzicka, Richard},
  ee = {http://doi.ieeecomputersociety.org/10.1109/DDECS.2013.6549829},
  interhash = {707f25efa53a801e2168c1afd14853fe},
  intrahash = {6aeaca534ed4db74016197c64bb665e4},
  isbn = {978-1-4673-6135-4},
  pages = {258-262},
  publisher = {IEEE Computer Society},
  title = {Reliability-aware cross-layer custom instruction screening.},
  url = {http://dblp.uni-trier.de/db/conf/ddecs/ddecs2013.html#FarahaniASF13},
  year = 2013
}

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