A Test Data Compression Method for System-on-a-Chip. Feng, J. & Li, G. In Proceedings of Symposium/Workshop on Electronic Design, Test and Applications (DELTA), pages 270-273, 2008. ![A Test Data Compression Method for System-on-a-Chip [link]](https://bibbase.org/img/filetypes/link.svg "link")
Paper bibtex @inproceedings{ dblp2797131,
title = {A Test Data Compression Method for System-on-a-Chip},
author = {Jianhua Feng and Guoliang Li},
author_short = {Feng, J. and Li, G.},
bibtype = {inproceedings},
type = {inproceedings},
year = {2008},
key = {dblp2797131},
id = {dblp2797131},
biburl = {http://www.dblp.org/rec/bibtex/conf/delta/FengL08},
url = {http://doi.ieeecomputersociety.org/10.1109/DELTA.2008.30},
conference = {DELTA},
pages = {270-273},
text = {DELTA 2008:270-273},
booktitle = {Proceedings of Symposium/Workshop on Electronic Design, Test and Applications (DELTA)}
}
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