A Test Data Compression Method for System-on-a-Chip. Feng, J. & Li, G. In Proceedings of Symposium/Workshop on Electronic Design, Test and Applications (DELTA), pages 270-273, 2008.
A Test Data Compression Method for System-on-a-Chip [link]Paper  bibtex   
@inproceedings{ dblp2797131,
  title = {A Test Data Compression Method for System-on-a-Chip},
  author = {Jianhua Feng and Guoliang Li},
  author_short = {Feng, J. and Li, G.},
  bibtype = {inproceedings},
  type = {inproceedings},
  year = {2008},
  key = {dblp2797131},
  id = {dblp2797131},
  biburl = {http://www.dblp.org/rec/bibtex/conf/delta/FengL08},
  url = {http://doi.ieeecomputersociety.org/10.1109/DELTA.2008.30},
  conference = {DELTA},
  pages = {270-273},
  text = {DELTA 2008:270-273},
  booktitle = {Proceedings of Symposium/Workshop on Electronic Design, Test and Applications (DELTA)}
}
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