@inproceedings{DBLP:conf/date/FengVJRV19,
  author       = {Keven Feng and
                  Sandeep Vora and
                  Rui Jiang and
                  Elyse Rosenbaum and
                  Shobha Vasudevan},
  editor       = {J{\"{u}}rgen Teich and
                  Franco Fummi},
  title        = {Guilty As Charged: Computational Reliability Threats Posed By Electrostatic
                  Discharge-induced Soft Errors},
  booktitle    = {Design, Automation {\&} Test in Europe Conference {\&} Exhibition,
                  {DATE} 2019, Florence, Italy, March 25-29, 2019},
  pages        = {156--161},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.23919/DATE.2019.8715149},
  doi          = {10.23919/DATE.2019.8715149},
  timestamp    = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl       = {https://dblp.org/rec/conf/date/FengVJRV19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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