Guilty As Charged: Computational Reliability Threats Posed By Electrostatic Discharge-induced Soft Errors. Feng, K., Vora, S., Jiang, R., Rosenbaum, E., & Vasudevan, S. In Teich, J. & Fummi, F., editors, Design, Automation & Test in Europe Conference & Exhibition, DATE 2019, Florence, Italy, March 25-29, 2019, pages 156–161, 2019. IEEE.
Guilty As Charged: Computational Reliability Threats Posed By Electrostatic Discharge-induced Soft Errors [link]Paper  doi  bibtex   
@inproceedings{DBLP:conf/date/FengVJRV19,
  author    = {Keven Feng and
               Sandeep Vora and
               Rui Jiang and
               Elyse Rosenbaum and
               Shobha Vasudevan},
  editor    = {J{\"{u}}rgen Teich and
               Franco Fummi},
  title     = {Guilty As Charged: Computational Reliability Threats Posed By Electrostatic
               Discharge-induced Soft Errors},
  booktitle = {Design, Automation {\&} Test in Europe Conference {\&} Exhibition,
               {DATE} 2019, Florence, Italy, March 25-29, 2019},
  pages     = {156--161},
  publisher = {{IEEE}},
  year      = {2019},
  url       = {https://doi.org/10.23919/DATE.2019.8715149},
  doi       = {10.23919/DATE.2019.8715149},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/conf/date/FengVJRV19.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}

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