Local Reconstruction of Birefringence in Bent Waveguides by Polarization-Sensitive Optical Low-Coherence Reflectometry. Ferrario, M., Bratovich, R., Morichetti, F., & Melloni, A. In European Conference on Integrated Optics, pages 189-192, 2008.
Local Reconstruction of Birefringence in Bent Waveguides by Polarization-Sensitive Optical Low-Coherence Reflectometry [pdf]Website  abstract   bibtex   
Polarization-sensitive optical low-coherence reflectometry (PS-OLCR) is advantageously exploited to recover local birefringence evolution inside planar waveguides, with a micrometer spatial resolution. In particular, PS-OLCR characterizations on bent waveguides have experimentally highlighted a bend-induced birefringence dependence on the square of the radius of curvature.
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 title = {Local Reconstruction of Birefringence in Bent Waveguides by Polarization-Sensitive Optical Low-Coherence Reflectometry},
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 abstract = {Polarization-sensitive optical low-coherence reflectometry (PS-OLCR) is advantageously exploited to recover local birefringence evolution inside planar waveguides, with a micrometer spatial resolution. In particular, PS-OLCR characterizations on bent waveguides have experimentally highlighted a bend-induced birefringence dependence on the square of the radius of curvature.},
 bibtype = {inproceedings},
 author = {Ferrario, Maddalena and Bratovich, Rudi and Morichetti, Francesco and Melloni, Andrea},
 booktitle = {European Conference on Integrated Optics}
}
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