Mutual compensation of mobility and threshold voltage temperature effects with applications in CMOS circuits. Filanovsky, I. & Allam, A. IEEE Transactions on Circuits and Systems I: Fundamental Theory and Applications, 48(7):876–884, July, 2001. doi abstract bibtex Mutual compensation of mobility and threshold voltage temperature variations may result in a zero temperature coefficient bias point of a MOS transistor. The conditions under which this effect occurs, and stability of this bias point are investigated. Possible applications of this effect include voltage reference circuits and temperature sensors with linear dependence of voltage versus temperature. The theory is verified experimentally investigating the temperature behavior of a simple voltage reference circuit realized in 0.35 μm CMOS process
@article{filanovsky_mutual_2001,
title = {Mutual compensation of mobility and threshold voltage temperature effects with applications in {CMOS} circuits},
volume = {48},
issn = {1057-7122},
doi = {10.1109/81.933328},
abstract = {Mutual compensation of mobility and threshold voltage temperature variations may result in a zero temperature coefficient bias point of a MOS transistor. The conditions under which this effect occurs, and stability of this bias point are investigated. Possible applications of this effect include voltage reference circuits and temperature sensors with linear dependence of voltage versus temperature. The theory is verified experimentally investigating the temperature behavior of a simple voltage reference circuit realized in 0.35 μm CMOS process},
number = {7},
journal = {IEEE Transactions on Circuits and Systems I: Fundamental Theory and Applications},
author = {Filanovsky, I.M. and Allam, A.},
month = jul,
year = {2001},
pages = {876--884}
}
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