{"_id":"H6EbZn74dWrSs6Zas","bibbaseid":"focksuitoo-chauchat-austin-tounsi-mermetguyennet-meuret-performanceandreliabilitytestingofmodernigbtdevicesundertypicaloperatingconditionsofaeronauticapplications-2008","authorIDs":[],"author_short":["Fock-Sui-Too, J. L.","Chauchat, B.","Austin, P.","Tounsi, P.","Mermet-Guyennet, M.","Meuret, R."],"bibdata":{"bibtype":"article","type":"article","author":[{"firstnames":["J.","L."],"propositions":[],"lastnames":["Fock-Sui-Too"],"suffixes":[]},{"firstnames":["B."],"propositions":[],"lastnames":["Chauchat"],"suffixes":[]},{"firstnames":["P."],"propositions":[],"lastnames":["Austin"],"suffixes":[]},{"firstnames":["Patrick"],"propositions":[],"lastnames":["Tounsi"],"suffixes":[]},{"firstnames":["Michel"],"propositions":[],"lastnames":["Mermet-Guyennet"],"suffixes":[]},{"firstnames":["Régis"],"propositions":[],"lastnames":["Meuret"],"suffixes":[]}],"title":"Performance and reliability testing of modern IGBT devices under typical operating conditions of aeronautic applications","journal":"Microelectron. Reliab.","volume":"48","number":"8-9","pages":"1453–1458","year":"2008","url":"https://doi.org/10.1016/j.microrel.2008.07.051","doi":"10.1016/j.microrel.2008.07.051","timestamp":"Sat, 22 Feb 2020 00:00:00 +0100","biburl":"https://dblp.org/rec/journals/mr/Fock-Sui-TooCATMM08.bib","bibsource":"dblp computer science bibliography, https://dblp.org","bibtex":"@article{DBLP:journals/mr/Fock-Sui-TooCATMM08,\n author = {J. L. Fock{-}Sui{-}Too and\n B. Chauchat and\n P. Austin and\n Patrick Tounsi and\n Michel Mermet{-}Guyennet and\n R{\\'{e}}gis Meuret},\n title = {Performance and reliability testing of modern {IGBT} devices under\n typical operating conditions of aeronautic applications},\n journal = {Microelectron. Reliab.},\n volume = {48},\n number = {8-9},\n pages = {1453--1458},\n year = {2008},\n url = {https://doi.org/10.1016/j.microrel.2008.07.051},\n doi = {10.1016/j.microrel.2008.07.051},\n timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},\n biburl = {https://dblp.org/rec/journals/mr/Fock-Sui-TooCATMM08.bib},\n bibsource = {dblp computer science bibliography, https://dblp.org}\n}\n\n","author_short":["Fock-Sui-Too, J. L.","Chauchat, B.","Austin, P.","Tounsi, P.","Mermet-Guyennet, M.","Meuret, R."],"key":"DBLP:journals/mr/Fock-Sui-TooCATMM08","id":"DBLP:journals/mr/Fock-Sui-TooCATMM08","bibbaseid":"focksuitoo-chauchat-austin-tounsi-mermetguyennet-meuret-performanceandreliabilitytestingofmodernigbtdevicesundertypicaloperatingconditionsofaeronauticapplications-2008","role":"author","urls":{"Paper":"https://doi.org/10.1016/j.microrel.2008.07.051"},"downloads":0},"bibtype":"article","biburl":"https://dblp.org/pid/42/8533.bib","creationDate":"2020-12-11T01:08:44.560Z","downloads":0,"keywords":[],"search_terms":["performance","reliability","testing","modern","igbt","devices","under","typical","operating","conditions","aeronautic","applications","fock-sui-too","chauchat","austin","tounsi","mermet-guyennet","meuret"],"title":"Performance and reliability testing of modern IGBT devices under typical operating conditions of aeronautic applications","year":2008,"dataSources":["mBzEJKydFBaFQyGa7"]}