Performance and reliability testing of modern IGBT devices under typical operating conditions of aeronautic applications. Fock-Sui-Too, J. L., Chauchat, B., Austin, P., Tounsi, P., Mermet-Guyennet, M., & Meuret, R. Microelectron. Reliab., 48(8-9):1453–1458, 2008.
Performance and reliability testing of modern IGBT devices under typical operating conditions of aeronautic applications [link]Paper  doi  bibtex   
@article{DBLP:journals/mr/Fock-Sui-TooCATMM08,
  author    = {J. L. Fock{-}Sui{-}Too and
               B. Chauchat and
               P. Austin and
               Patrick Tounsi and
               Michel Mermet{-}Guyennet and
               R{\'{e}}gis Meuret},
  title     = {Performance and reliability testing of modern {IGBT} devices under
               typical operating conditions of aeronautic applications},
  journal   = {Microelectron. Reliab.},
  volume    = {48},
  number    = {8-9},
  pages     = {1453--1458},
  year      = {2008},
  url       = {https://doi.org/10.1016/j.microrel.2008.07.051},
  doi       = {10.1016/j.microrel.2008.07.051},
  timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/journals/mr/Fock-Sui-TooCATMM08.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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