Advances in theory, instrumentation, semiconductor, and materials applications of scanning microscopy. Foster, J., Rango, A, Josberger, E., Erbe, E., Pooley, C., & Weregin, W. Scanning, 2004.
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Paper abstract bibtex
Paper abstract bibtex It is important to monitor the development of seasonal snow cover classes (tundra, taiga, alpine, maritime, prairie and ephemeral) worldwide and to visualize and understand snow crystal metamorphism. Low-temperature, scanning electron microscopy provides a superior form of snow crystal imaging and was successfully tested in taiga, alpine and prairie snowpacks with approximately 50% of the total depth made up of depth hoar crystals. The technique can be used easily for field data collection and provides a new tool for studying important snowpack processes with applications to avalanche and water supply forecasting.
@article{foster_advances_2004,
title = {Advances in theory, instrumentation, semiconductor, and materials applications of scanning microscopy},
volume = {26},
url = {bibliography/04-056.pdf},
abstract = {It is important to monitor the development of seasonal snow cover classes (tundra, taiga, alpine, maritime, prairie and ephemeral) worldwide and to visualize and understand snow crystal metamorphism. Low-temperature, scanning electron microscopy provides a superior form of snow crystal imaging and was successfully tested in taiga, alpine and prairie snowpacks with approximately 50\% of the total depth made up of depth hoar crystals. The technique can be used easily for field data collection and provides a new tool for studying important snowpack processes with applications to avalanche and water supply forecasting.},
journal = {Scanning},
author = {Foster, J., D.R./Aber and Rango, A and Josberger, E.G. and Erbe, E.F. and Pooley, C.D. and Weregin, W.P.},
year = {2004},
keywords = {JRN, tundra}
}Downloads: 0
{"_id":"jMobp3sTBpQqw2B7R","bibbaseid":"foster-rango-josberger-erbe-pooley-weregin-advancesintheoryinstrumentationsemiconductorandmaterialsapplicationsofscanningmicroscopy-2004","downloads":0,"creationDate":"2018-08-10T13:52:48.100Z","title":"Advances in theory, instrumentation, semiconductor, and materials applications of scanning microscopy","author_short":["Foster, J.","Rango, A","Josberger, E.","Erbe, E.","Pooley, C.","Weregin, W."],"year":2004,"bibtype":"article","biburl":"https://utexas.box.com/shared/static/1aa39ptglchcfuw9c04ozm0pqjlxu4rw.bib","bibdata":{"bibtype":"article","type":"article","title":"Advances in theory, instrumentation, semiconductor, and materials applications of scanning microscopy","volume":"26","url":"bibliography/04-056.pdf","abstract":"It is important to monitor the development of seasonal snow cover classes (tundra, taiga, alpine, maritime, prairie and ephemeral) worldwide and to visualize and understand snow crystal metamorphism. Low-temperature, scanning electron microscopy provides a superior form of snow crystal imaging and was successfully tested in taiga, alpine and prairie snowpacks with approximately 50% of the total depth made up of depth hoar crystals. The technique can be used easily for field data collection and provides a new tool for studying important snowpack processes with applications to avalanche and water supply forecasting.","journal":"Scanning","author":[{"propositions":[],"lastnames":["Foster"],"firstnames":["J."],"suffixes":["D.R./Aber"]},{"propositions":[],"lastnames":["Rango"],"firstnames":["A"],"suffixes":[]},{"propositions":[],"lastnames":["Josberger"],"firstnames":["E.G."],"suffixes":[]},{"propositions":[],"lastnames":["Erbe"],"firstnames":["E.F."],"suffixes":[]},{"propositions":[],"lastnames":["Pooley"],"firstnames":["C.D."],"suffixes":[]},{"propositions":[],"lastnames":["Weregin"],"firstnames":["W.P."],"suffixes":[]}],"year":"2004","keywords":"JRN, tundra","bibtex":"@article{foster_advances_2004,\n\ttitle = {Advances in theory, instrumentation, semiconductor, and materials applications of scanning microscopy},\n\tvolume = {26},\n\turl = {bibliography/04-056.pdf},\n\tabstract = {It is important to monitor the development of seasonal snow cover classes (tundra, taiga, alpine, maritime, prairie and ephemeral) worldwide and to visualize and understand snow crystal metamorphism. Low-temperature, scanning electron microscopy provides a superior form of snow crystal imaging and was successfully tested in taiga, alpine and prairie snowpacks with approximately 50\\% of the total depth made up of depth hoar crystals. The technique can be used easily for field data collection and provides a new tool for studying important snowpack processes with applications to avalanche and water supply forecasting.},\n\tjournal = {Scanning},\n\tauthor = {Foster, J., D.R./Aber and Rango, A and Josberger, E.G. and Erbe, E.F. and Pooley, C.D. and Weregin, W.P.},\n\tyear = {2004},\n\tkeywords = {JRN, tundra}\n}\n\n","author_short":["Foster, J.","Rango, A","Josberger, E.","Erbe, E.","Pooley, C.","Weregin, W."],"key":"foster_advances_2004","id":"foster_advances_2004","bibbaseid":"foster-rango-josberger-erbe-pooley-weregin-advancesintheoryinstrumentationsemiconductorandmaterialsapplicationsofscanningmicroscopy-2004","role":"author","urls":{"Paper":"https://utexas.box.com/shared/static/bibliography/04-056.pdf"},"keyword":["JRN","tundra"],"downloads":0},"search_terms":["advances","theory","instrumentation","semiconductor","materials","applications","scanning","microscopy","foster","rango","josberger","erbe","pooley","weregin"],"keywords":["jrn","tundra"],"authorIDs":[],"dataSources":["gCjo799mKWJtJmSdX"]}