Setup for an Experimental Study of Radiation Effects in 65nm CMOS. Fritz, B., Steininger, A., Simek, V., & Veeravalli, V. S. In Kubátová, H., Novotný, M., & Skavhaug, A., editors, DSD, pages 329-336, 2017. IEEE Computer Society.
Setup for an Experimental Study of Radiation Effects in 65nm CMOS. [link]Link  Setup for an Experimental Study of Radiation Effects in 65nm CMOS. [link]Paper  bibtex   
@inproceedings{conf/dsd/FritzSSV17,
  added-at = {2017-10-16T00:00:00.000+0200},
  author = {Fritz, Bernhard and Steininger, Andreas and Simek, Vaclav and Veeravalli, Varadan Savulimedu},
  biburl = {https://www.bibsonomy.org/bibtex/2343680f884a8598af56d195d62e52cdc/dblp},
  booktitle = {DSD},
  crossref = {conf/dsd/2017},
  editor = {Kubátová, Hana and Novotný, Martin and Skavhaug, Amund},
  ee = {http://doi.ieeecomputersociety.org/10.1109/DSD.2017.60},
  interhash = {a1ce36ce2a2a6ede699c2f0c2fcef6cd},
  intrahash = {343680f884a8598af56d195d62e52cdc},
  isbn = {978-1-5386-2146-2},
  keywords = {dblp},
  pages = {329-336},
  publisher = {IEEE Computer Society},
  timestamp = {2017-12-07T22:52:12.000+0100},
  title = {Setup for an Experimental Study of Radiation Effects in 65nm CMOS.},
  url = {http://dblp.uni-trier.de/db/conf/dsd/dsd2017.html#FritzSSV17},
  year = 2017
}

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