SRAM for error-tolerant applications with dynamic energy-quality management in 28 nm CMOS. Frustaci, F., Khayatzadeh, M., Blaauw, D., Sylvester, D., & Alioto, M. IEEE Journal of Solid-State Circuits, 50(5):1310–1323, IEEE, 2015. bibtex @Article{Frustaci2015,
author = {Frustaci, Fabio and Khayatzadeh, Mahmood and Blaauw, David and Sylvester, Dennis and Alioto, Massimo},
title = {{SRAM} for error-tolerant applications with dynamic energy-quality management in 28 nm {CMOS}},
volume = {50},
number = {5},
pages = {1310--1323},
year = {2015},
journal = {IEEE Journal of Solid-State Circuits},
publisher = {IEEE},
}
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