Electron beam blanking systems. Fujioka, H. & Ura, K. Scanning, 5(1):3–13, January, 1983. Paper doi abstract bibtex Electron beam blanking in the scanning electron microscope (SEM) by deflection over a chopping aperture is reviewed. The first part is concerned with electron beam deflection structures and driving methods, the second part with electron optics of deflection blanking systems in the SEM.
@article{fujioka_electron_1983,
title = {Electron beam blanking systems},
volume = {5},
issn = {1932-8745},
url = {http://onlinelibrary.wiley.com/doi/10.1002/sca.4950050102/abstract},
doi = {10.1002/sca.4950050102},
abstract = {Electron beam blanking in the scanning electron microscope (SEM) by deflection over a chopping aperture is reviewed. The first part is concerned with electron beam deflection structures and driving methods, the second part with electron optics of deflection blanking systems in the SEM.},
language = {en},
number = {1},
urldate = {2017-07-27},
journal = {Scanning},
author = {Fujioka, H. and Ura, K.},
month = jan,
year = {1983},
pages = {3--13},
}
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{"_id":"7oayHwiWgAbchv7cP","bibbaseid":"fujioka-ura-electronbeamblankingsystems-1983","author_short":["Fujioka, H.","Ura, K."],"bibdata":{"bibtype":"article","type":"article","title":"Electron beam blanking systems","volume":"5","issn":"1932-8745","url":"http://onlinelibrary.wiley.com/doi/10.1002/sca.4950050102/abstract","doi":"10.1002/sca.4950050102","abstract":"Electron beam blanking in the scanning electron microscope (SEM) by deflection over a chopping aperture is reviewed. The first part is concerned with electron beam deflection structures and driving methods, the second part with electron optics of deflection blanking systems in the SEM.","language":"en","number":"1","urldate":"2017-07-27","journal":"Scanning","author":[{"propositions":[],"lastnames":["Fujioka"],"firstnames":["H."],"suffixes":[]},{"propositions":[],"lastnames":["Ura"],"firstnames":["K."],"suffixes":[]}],"month":"January","year":"1983","pages":"3–13","bibtex":"@article{fujioka_electron_1983,\n\ttitle = {Electron beam blanking systems},\n\tvolume = {5},\n\tissn = {1932-8745},\n\turl = {http://onlinelibrary.wiley.com/doi/10.1002/sca.4950050102/abstract},\n\tdoi = {10.1002/sca.4950050102},\n\tabstract = {Electron beam blanking in the scanning electron microscope (SEM) by deflection over a chopping aperture is reviewed. The first part is concerned with electron beam deflection structures and driving methods, the second part with electron optics of deflection blanking systems in the SEM.},\n\tlanguage = {en},\n\tnumber = {1},\n\turldate = {2017-07-27},\n\tjournal = {Scanning},\n\tauthor = {Fujioka, H. and Ura, K.},\n\tmonth = jan,\n\tyear = {1983},\n\tpages = {3--13},\n}\n\n","author_short":["Fujioka, H.","Ura, K."],"key":"fujioka_electron_1983","id":"fujioka_electron_1983","bibbaseid":"fujioka-ura-electronbeamblankingsystems-1983","role":"author","urls":{"Paper":"http://onlinelibrary.wiley.com/doi/10.1002/sca.4950050102/abstract"},"metadata":{"authorlinks":{}},"html":""},"bibtype":"article","biburl":"https://bibbase.org/zotero/spintextures","dataSources":["rXHvWQJHcL8ctHS4s"],"keywords":[],"search_terms":["electron","beam","blanking","systems","fujioka","ura"],"title":"Electron beam blanking systems","year":1983}