Electron beam blanking systems. Fujioka, H. & Ura, K. Scanning, 5(1):3–13, January, 1983.
Electron beam blanking systems [link]Paper  doi  abstract   bibtex   
Electron beam blanking in the scanning electron microscope (SEM) by deflection over a chopping aperture is reviewed. The first part is concerned with electron beam deflection structures and driving methods, the second part with electron optics of deflection blanking systems in the SEM.
@article{fujioka_electron_1983,
	title = {Electron beam blanking systems},
	volume = {5},
	issn = {1932-8745},
	url = {http://onlinelibrary.wiley.com/doi/10.1002/sca.4950050102/abstract},
	doi = {10.1002/sca.4950050102},
	abstract = {Electron beam blanking in the scanning electron microscope (SEM) by deflection over a chopping aperture is reviewed. The first part is concerned with electron beam deflection structures and driving methods, the second part with electron optics of deflection blanking systems in the SEM.},
	language = {en},
	number = {1},
	urldate = {2017-07-27},
	journal = {Scanning},
	author = {Fujioka, H. and Ura, K.},
	month = jan,
	year = {1983},
	pages = {3--13},
}

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