@article{DBLP:journals/di/FukamiGLCM17,
  author    = {Aya Fukami and
               Saugata Ghose and
               Yixin Luo and
               Yu Cai and
               Onur Mutlu},
  title     = {Improving the reliability of chip-off forensic analysis of {NAND}
               flash memory devices},
  journal   = {Digit. Investig.},
  volume    = {20 Supplement},
  pages     = {S1--S11},
  year      = {2017},
  url       = {https://doi.org/10.1016/j.diin.2017.01.011},
  doi       = {10.1016/j.diin.2017.01.011},
  timestamp = {Wed, 17 Nov 2021 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/journals/di/FukamiGLCM17.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}

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