Stochastic identification of defects under sensor uncertainties. Furukawa, T., Lim, S. H., & Michopoulos, J. G. 2011.
bibtex   
@article{1296,
  author = {Tomonari Furukawa and Shen Hin Lim and John G. Michopoulos},
  title = {Stochastic identification of defects under sensor uncertainties},
  year = {2011}
}

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