{"_id":"zCBgdDJszf5kaKCDR","bibbaseid":"furukawa-lim-michopoulos-stochasticidentificationofdefectsundersensoruncertainties-2011","author_short":["Furukawa, T.","Lim, S. H.","Michopoulos, J. G."],"bibdata":{"bibtype":"article","type":"article","author":[{"firstnames":["Tomonari"],"propositions":[],"lastnames":["Furukawa"],"suffixes":[]},{"firstnames":["Shen","Hin"],"propositions":[],"lastnames":["Lim"],"suffixes":[]},{"firstnames":["John","G."],"propositions":[],"lastnames":["Michopoulos"],"suffixes":[]}],"title":"Stochastic identification of defects under sensor uncertainties","year":"2011","bibtex":"@article{1296,\n author = {Tomonari Furukawa and Shen Hin Lim and John G. Michopoulos},\n title = {Stochastic identification of defects under sensor uncertainties},\n year = {2011}\n}\n\n","author_short":["Furukawa, T.","Lim, S. H.","Michopoulos, J. G."],"key":"1296","id":"1296","bibbaseid":"furukawa-lim-michopoulos-stochasticidentificationofdefectsundersensoruncertainties-2011","role":"author","urls":{},"metadata":{"authorlinks":{}}},"bibtype":"article","biburl":"https://bibbase.org/f/QuW9NyeKMp6Cj3mam/Link_Lab_Publications.bib","dataSources":["GXL8BuKffZ6XGRvhu","zTwdZBrCqogZ6yMmD","A9Zuq8B85Rd3bHeNs","zq8E4CA9zBjkA2p7P","b7zvHnuSqhTvwNoon","BE493TFz6wWiE9NkC","6CYcgzsh5rhZhtcXe","WCSuxR2upo4FXxxRm"],"keywords":[],"search_terms":["stochastic","identification","defects","under","sensor","uncertainties","furukawa","lim","michopoulos"],"title":"Stochastic identification of defects under sensor uncertainties","year":2011}