Modeling and Simulating Multiple Failure Masking Enabled by Local Recovery for Stencil-Based Applications at Extreme Scales. Gamell, M., Teranishi, K., Mayo, J., Kolla, H., Heroux, M. A., Chen, J., & Parashar, M. IEEE Trans. Parallel Distrib. Syst., 28(10):2881–2895, 2017.
Modeling and Simulating Multiple Failure Masking Enabled by Local Recovery for Stencil-Based Applications at Extreme Scales [link]Paper  doi  bibtex   
@article{DBLP:journals/tpds/GamellTMKHCP17,
  author    = {Marc Gamell and
               Keita Teranishi and
               Jackson Mayo and
               Hemanth Kolla and
               Michael A. Heroux and
               Jacqueline Chen and
               Manish Parashar},
  title     = {Modeling and Simulating Multiple Failure Masking Enabled by Local
               Recovery for Stencil-Based Applications at Extreme Scales},
  journal   = {{IEEE} Trans. Parallel Distrib. Syst.},
  volume    = {28},
  number    = {10},
  pages     = {2881--2895},
  year      = {2017},
  url       = {https://doi.org/10.1109/TPDS.2017.2696538},
  doi       = {10.1109/TPDS.2017.2696538},
  timestamp = {Mon, 16 Oct 2017 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/tpds/GamellTMKHCP17},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}

Downloads: 0