Modeling and Simulating Multiple Failure Masking Enabled by Local Recovery for Stencil-Based Applications at Extreme Scales. Gamell, M., Teranishi, K., Mayo, J., Kolla, H., Heroux, M. A., Chen, J., & Parashar, M. IEEE Trans. Parallel Distrib. Syst., 28(10):2881–2895, 2017. Paper doi bibtex @article{DBLP:journals/tpds/GamellTMKHCP17,
author = {Marc Gamell and
Keita Teranishi and
Jackson Mayo and
Hemanth Kolla and
Michael A. Heroux and
Jacqueline Chen and
Manish Parashar},
title = {Modeling and Simulating Multiple Failure Masking Enabled by Local
Recovery for Stencil-Based Applications at Extreme Scales},
journal = {{IEEE} Trans. Parallel Distrib. Syst.},
volume = {28},
number = {10},
pages = {2881--2895},
year = {2017},
url = {https://doi.org/10.1109/TPDS.2017.2696538},
doi = {10.1109/TPDS.2017.2696538},
timestamp = {Mon, 16 Oct 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/bib/journals/tpds/GamellTMKHCP17},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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