@article{334,
  author = {Shijie Gao and Lauren Bramblett and Nicola Bezzo},
  title = {Take Your Best Shot: Sampling-Based Next-Best-View Planning for
  Autonomous Photography & Inspection},
  year = {2024},
  journal = {arXiv (Cornell University)},
  url = {https://arxiv.org/abs/2403.05477}
}

{"_id":"dC9BQZJDzNMEkMY9E","bibbaseid":"gao-bramblett-bezzo-takeyourbestshotsamplingbasednextbestviewplanningforautonomousphotographyinspection-2024","author_short":["Gao, S.","Bramblett, L.","Bezzo, N."],"bibdata":{"bibtype":"article","type":"article","author":[{"firstnames":["Shijie"],"propositions":[],"lastnames":["Gao"],"suffixes":[]},{"firstnames":["Lauren"],"propositions":[],"lastnames":["Bramblett"],"suffixes":[]},{"firstnames":["Nicola"],"propositions":[],"lastnames":["Bezzo"],"suffixes":[]}],"title":"Take Your Best Shot: Sampling-Based Next-Best-View Planning for Autonomous Photography & Inspection","year":"2024","journal":"arXiv (Cornell University)","url":"https://arxiv.org/abs/2403.05477","bibtex":"@article{334,\n author = {Shijie Gao and Lauren Bramblett and Nicola Bezzo},\n title = {Take Your Best Shot: Sampling-Based Next-Best-View Planning for\n Autonomous Photography & Inspection},\n year = {2024},\n journal = {arXiv (Cornell University)},\n url = {https://arxiv.org/abs/2403.05477}\n}\n\n","author_short":["Gao, S.","Bramblett, L.","Bezzo, N."],"key":"334","id":"334","bibbaseid":"gao-bramblett-bezzo-takeyourbestshotsamplingbasednextbestviewplanningforautonomousphotographyinspection-2024","role":"author","urls":{"Paper":"https://arxiv.org/abs/2403.05477"},"metadata":{"authorlinks":{}}},"bibtype":"article","biburl":"https://bibbase.org/f/fFERMKNwKyHLsDPJ3/Link_Lab_Publications.bib","dataSources":["mwAui9iKniQyhTc49","RbCkvcfqfbgtxTyNT","m6hDbtiptxFxNGk8y","Kg2u32BaLYeEZkT9t"],"keywords":[],"search_terms":["take","best","shot","sampling","based","next","best","view","planning","autonomous","photography","inspection","gao","bramblett","bezzo"],"title":"Take Your Best Shot: Sampling-Based Next-Best-View Planning for Autonomous Photography & Inspection","year":2024}