X‐ray Double‐Exposure Holography

X‐ray Double‐Exposure Holography. Gao, H., Chen, J., Xie, H., & Xu, Z. In AIP Conference Proceedings, volume 641, pages 495–497, November, 2002. American Institute of Physics.

Paper doi abstract bibtex

Double‐exposure holography for measuring phase information in X‐ray fields is suggested in this paper. The double‐exposure method cannot only obtain directly the phase information, but also gives qualitative and quantitative results. This means also that one can obtain simultaneous information about both the amplitude and phase in an experiment.

@inproceedings{gao_xray_2002,
	title = {X‐ray {Double}‐{Exposure} {Holography}},
	volume = {641},
	url = {http://scitation.aip.org/content/aip/proceeding/aipcp/10.1063/1.1521066},
	doi = {10.1063/1.1521066},
	abstract = {Double‐exposure holography for measuring phase information in X‐ray fields is suggested in this paper. The double‐exposure method cannot only obtain directly the phase information, but also gives qualitative and quantitative results. This means also that one can obtain simultaneous information about both the amplitude and phase in an experiment.},
	urldate = {2013-11-25},
	booktitle = {{AIP} {Conference} {Proceedings}},
	publisher = {American Institute of Physics},
	author = {Gao, Hongyi and Chen, Jianwen and Xie, Honglan and Xu, Zhizhan},
	month = nov,
	year = {2002},
	keywords = {HOLOGRAPHY, Holography},
	pages = {495--497},
}

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