@article{gao_three-terminal_2009,
	title = {Three-terminal electric transport measurements on gold nano-particles combined with ex situ {TEM} inspection},
	volume = {20},
	issn = {0957-4484},
	url = {http://stacks.iop.org/0957-4484/20/i=41/a=415207},
	doi = {10.1088/0957-4484/20/41/415207},
	abstract = {We have fabricated nanometer-spaced electrodes on electron-transparent silicon nitride membranes. A thin Cr/Au layer is evaporated on the backside of the membrane which serves as a gate electrode. Using these devices, we have performed three-terminal electron transport measurements on gold nano-particles at liquid helium temperature. Coulomb Blockade features have been observed and the capacitance to the gate has been extracted. After transport measurements, the Cr/Au back gate is removed and the devices are inspected with a transmission-electron microscope (TEM). TEM inspection reveals the presence of a few nano-particles in the nanogap, which is in agreement with the transport measurements. In addition, the nano-particle size as observed by TEM coincides with the one estimated from the gate capacitance value.},
	language = {en},
	number = {41},
	urldate = {2016-12-08},
	journal = {Nanotechnology},
	author = {Gao, B. and Osorio, E. A. and Gaven, K. Babaei and Zant, H. S. J. van der},
	year = {2009},
	pages = {415207},
}

{"_id":"9WavWTtigoKL7vdwW","bibbaseid":"gao-osorio-gaven-zant-threeterminalelectrictransportmeasurementsongoldnanoparticlescombinedwithexsituteminspection-2009","author_short":["Gao, B.","Osorio, E. A.","Gaven, K. B.","Zant, H. S. J. v. d."],"bibdata":{"bibtype":"article","type":"article","title":"Three-terminal electric transport measurements on gold nano-particles combined with ex situ TEM inspection","volume":"20","issn":"0957-4484","url":"http://stacks.iop.org/0957-4484/20/i=41/a=415207","doi":"10.1088/0957-4484/20/41/415207","abstract":"We have fabricated nanometer-spaced electrodes on electron-transparent silicon nitride membranes. A thin Cr/Au layer is evaporated on the backside of the membrane which serves as a gate electrode. Using these devices, we have performed three-terminal electron transport measurements on gold nano-particles at liquid helium temperature. Coulomb Blockade features have been observed and the capacitance to the gate has been extracted. After transport measurements, the Cr/Au back gate is removed and the devices are inspected with a transmission-electron microscope (TEM). TEM inspection reveals the presence of a few nano-particles in the nanogap, which is in agreement with the transport measurements. In addition, the nano-particle size as observed by TEM coincides with the one estimated from the gate capacitance value.","language":"en","number":"41","urldate":"2016-12-08","journal":"Nanotechnology","author":[{"propositions":[],"lastnames":["Gao"],"firstnames":["B."],"suffixes":[]},{"propositions":[],"lastnames":["Osorio"],"firstnames":["E.","A."],"suffixes":[]},{"propositions":[],"lastnames":["Gaven"],"firstnames":["K.","Babaei"],"suffixes":[]},{"propositions":[],"lastnames":["Zant"],"firstnames":["H.","S.","J.","van","der"],"suffixes":[]}],"year":"2009","pages":"415207","bibtex":"@article{gao_three-terminal_2009,\n\ttitle = {Three-terminal electric transport measurements on gold nano-particles combined with ex situ {TEM} inspection},\n\tvolume = {20},\n\tissn = {0957-4484},\n\turl = {http://stacks.iop.org/0957-4484/20/i=41/a=415207},\n\tdoi = {10.1088/0957-4484/20/41/415207},\n\tabstract = {We have fabricated nanometer-spaced electrodes on electron-transparent silicon nitride membranes. A thin Cr/Au layer is evaporated on the backside of the membrane which serves as a gate electrode. Using these devices, we have performed three-terminal electron transport measurements on gold nano-particles at liquid helium temperature. Coulomb Blockade features have been observed and the capacitance to the gate has been extracted. After transport measurements, the Cr/Au back gate is removed and the devices are inspected with a transmission-electron microscope (TEM). TEM inspection reveals the presence of a few nano-particles in the nanogap, which is in agreement with the transport measurements. In addition, the nano-particle size as observed by TEM coincides with the one estimated from the gate capacitance value.},\n\tlanguage = {en},\n\tnumber = {41},\n\turldate = {2016-12-08},\n\tjournal = {Nanotechnology},\n\tauthor = {Gao, B. and Osorio, E. A. and Gaven, K. Babaei and Zant, H. S. J. van der},\n\tyear = {2009},\n\tpages = {415207},\n}\n\n","author_short":["Gao, B.","Osorio, E. A.","Gaven, K. B.","Zant, H. S. J. v. d."],"key":"gao_three-terminal_2009","id":"gao_three-terminal_2009","bibbaseid":"gao-osorio-gaven-zant-threeterminalelectrictransportmeasurementsongoldnanoparticlescombinedwithexsituteminspection-2009","role":"author","urls":{"Paper":"http://stacks.iop.org/0957-4484/20/i=41/a=415207"},"metadata":{"authorlinks":{}},"html":""},"bibtype":"article","biburl":"https://bibbase.org/zotero/spintextures","dataSources":["rXHvWQJHcL8ctHS4s"],"keywords":[],"search_terms":["three","terminal","electric","transport","measurements","gold","nano","particles","combined","situ","tem","inspection","gao","osorio","gaven","zant"],"title":"Three-terminal electric transport measurements on gold nano-particles combined with ex situ TEM inspection","year":2009}