Three-terminal electric transport measurements on gold nano-particles combined with ex situ TEM inspection. Gao, B., Osorio, E. A., Gaven, K. B., & Zant, H. S. J. v. d. Nanotechnology, 20(41):415207, 2009.
Three-terminal electric transport measurements on gold nano-particles combined with ex situ TEM inspection [link]Paper  doi  abstract   bibtex   
We have fabricated nanometer-spaced electrodes on electron-transparent silicon nitride membranes. A thin Cr/Au layer is evaporated on the backside of the membrane which serves as a gate electrode. Using these devices, we have performed three-terminal electron transport measurements on gold nano-particles at liquid helium temperature. Coulomb Blockade features have been observed and the capacitance to the gate has been extracted. After transport measurements, the Cr/Au back gate is removed and the devices are inspected with a transmission-electron microscope (TEM). TEM inspection reveals the presence of a few nano-particles in the nanogap, which is in agreement with the transport measurements. In addition, the nano-particle size as observed by TEM coincides with the one estimated from the gate capacitance value.
@article{gao_three-terminal_2009,
	title = {Three-terminal electric transport measurements on gold nano-particles combined with ex situ {TEM} inspection},
	volume = {20},
	issn = {0957-4484},
	url = {http://stacks.iop.org/0957-4484/20/i=41/a=415207},
	doi = {10.1088/0957-4484/20/41/415207},
	abstract = {We have fabricated nanometer-spaced electrodes on electron-transparent silicon nitride membranes. A thin Cr/Au layer is evaporated on the backside of the membrane which serves as a gate electrode. Using these devices, we have performed three-terminal electron transport measurements on gold nano-particles at liquid helium temperature. Coulomb Blockade features have been observed and the capacitance to the gate has been extracted. After transport measurements, the Cr/Au back gate is removed and the devices are inspected with a transmission-electron microscope (TEM). TEM inspection reveals the presence of a few nano-particles in the nanogap, which is in agreement with the transport measurements. In addition, the nano-particle size as observed by TEM coincides with the one estimated from the gate capacitance value.},
	language = {en},
	number = {41},
	urldate = {2016-12-08},
	journal = {Nanotechnology},
	author = {Gao, B. and Osorio, E. A. and Gaven, K. Babaei and Zant, H. S. J. van der},
	year = {2009},
	pages = {415207},
}

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