@article{gao_situ_2011,
	title = {In situ transmission electron microscopy imaging of grain growth in a platinum nanobridge induced by electric current annealing},
	volume = {22},
	issn = {0957-4484},
	url = {http://stacks.iop.org/0957-4484/22/i=20/a=205705},
	doi = {10.1088/0957-4484/22/20/205705},
	abstract = {We report an in situ transmission electron microscopy (TEM) imaging of grain growth in a Pt nanobridge induced by a high electric current density. The change in morphology at the nanoscale was recorded in real time together with the electrical characterization of the Pt nanobridge. We find a drop in the differential resistance as the voltage across the bridge is increased; TEM inspection shows that this coincides with thermally induced grain growth, indicating that a reduction of grain boundary scattering is the cause of the resistance decrease.},
	language = {en},
	number = {20},
	urldate = {2016-12-08},
	journal = {Nanotechnology},
	author = {Gao, B. and Rudneva, M. and McGarrity, K. S. and Xu, Q. and Prins, F. and Thijssen, J. M. and Zandbergen, H. and Zant, H. S. J. van der},
	year = {2011},
	pages = {205705},
}

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