A Physics based MTJ Compact Model for State-of-the-Art and Emerging STT-MRAM Failure Analysis and Yield Enhancement. Gaul, N. S, Jaiswal, A., Yoon, H., Lee, T., Yamane, K., Versaggi, J., Carter, R., & Paul, B. C In 2022 IEEE International Memory Workshop (IMW), pages 1–4, 2022. IEEE.
bibtex   
@inproceedings{gaul2022physics,
  title={A Physics based MTJ Compact Model for State-of-the-Art and Emerging STT-MRAM Failure Analysis and Yield Enhancement},
  author={Gaul, Nishtha S and Jaiswal, Akhilesh and Yoon, Hongsik and Lee, Taeyoung and Yamane, Kazutaka and Versaggi, Joe and Carter, Rick and Paul, Bipul C},
  booktitle={2022 IEEE International Memory Workshop (IMW)},
  pages={1--4},
  year={2022},
  organization={IEEE}
}

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