Integrating Self Testability with Design Space Exploration by a Controller based Estimation Technique

Integrating Self Testability with Design Space Exploration by a Controller based Estimation Technique. Gaur, M. S. & Zwolinski, M. In 17th International Conference on VLSI Design (VLSI Design 2004), with the 3rd International Conference on Embedded Systems Design, 5-9 January 2004, Mumbai, India, pages 901–906, 2004.

Paper doi bibtex

@inproceedings{DBLP:conf/vlsid/GaurZ04,
  author       = {Manoj Singh Gaur and
                  Mark Zwolinski},
  title        = {Integrating Self Testability with Design Space Exploration by a Controller
                  based Estimation Technique},
  booktitle    = {17th International Conference on {VLSI} Design {(VLSI} Design 2004),
                  with the 3rd International Conference on Embedded Systems Design,
                  5-9 January 2004, Mumbai, India},
  pages        = {901--906},
  year         = {2004},
  crossref     = {DBLP:conf/vlsid/2004},
  url          = {https://doi.org/10.1109/ICVD.2004.1261045},
  doi          = {10.1109/ICVD.2004.1261045},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vlsid/GaurZ04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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