Integrating Self Testability with Design Space Exploration by a Controller based Estimation Technique. Gaur, M. S. & Zwolinski, M. In 17th International Conference on VLSI Design (VLSI Design 2004), with the 3rd International Conference on Embedded Systems Design, 5-9 January 2004, Mumbai, India, pages 901–906, 2004.
Integrating Self Testability with Design Space Exploration by a Controller based Estimation Technique [link]Paper  doi  bibtex   
@inproceedings{DBLP:conf/vlsid/GaurZ04,
  author    = {Manoj Singh Gaur and
               Mark Zwolinski},
  title     = {Integrating Self Testability with Design Space Exploration by a Controller
               based Estimation Technique},
  booktitle = {17th International Conference on {VLSI} Design {(VLSI} Design 2004),
               with the 3rd International Conference on Embedded Systems Design,
               5-9 January 2004, Mumbai, India},
  pages     = {901--906},
  year      = {2004},
  crossref  = {DBLP:conf/vlsid/2004},
  url       = {https://doi.org/10.1109/ICVD.2004.1261045},
  doi       = {10.1109/ICVD.2004.1261045},
  timestamp = {Mon, 15 Jun 2020 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/conf/vlsid/GaurZ04.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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